INOE 2000 - Pulsed-laser deposition of smooth thin films of Er, Pr and Nd doped glasses

Who we are

We are the National R&D Institute for Optoelectronics.

The Institute comprises six research departments, two certified test laboratories and two legal subsidiaries: the Institute of Analytical Instrumentation Research - ICIA (http://www.icia.ro) and the Hydraulics and Pneumatics Research Institute – IHP ( http://www.ihp.ro)..

What we do

The Institute develops fundamental and applicative research in optoelectronics, analytical chemistry and mechanical engineering, aligning itself to the vital scientific directions of the European Research Area.

What we offer

INOE is committed to moving forward, to reshape the multi‐disciplinary approach into a crossdisciplinary research, targeting more closely the optoelectronics domain, taking a step forward in the physical engineering field of optoelectronics.

An important effort is continuously dedicated for keeping up the cohesion in the research activity by creating and sustaining a regional knowledge network.

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G. Epurescu, A. Vlad, M. A. Bodea, C. Vasiliu, O. Dumitrescu, H. Niciu, M. Elisa, K. Siraj, J. D. Pedarnig, D. Bäuerle, M. Filipescu, A. Nedelcea, A. C. Gâlcă, C. E. A. Grigorescu, M. Dinescu, Pulsed-laser deposition of smooth thin films of Er, Pr and Nd doped glasses, Appl. Surf. Sci., 255/10 (2009) 5295-5298

Title: Pulsed-laser deposition of smooth thin films of Er, Pr and Nd doped glasses

Abstract: Thin films of complex oxides have been obtained by pulsed-laser deposition (PLD) from glass targets belonging to the system Li(2)O-Al(2)O(3)-P(2)O(5)-(RE)(2)O(3), with RE = Nd, Pr, Er. The films were deposited on quartz, silicon and ITO/glass substrates using a F(2) laser (lambda = 157 nm, iota approximate to 20 ns) for ablation in vacuum. The structural, morphological and optical properties of the oxide films were investigated through IR and UV-VIS spectroscopy, Atomic Force Microscopy (AFM), Scanning Electron Microscopy, Energy Dispersive X-ray Spectroscopy (SEM-EDX) and Spectroscopic Ellipsometry. The laser wavelength was found to be the key parameter to obtain thin films with very smooth surface. In this way new possibilities are opened to grow multilayer structures for photonic applications. (C) 2008 Elsevier B. V. All rights reserved.

Key words: Phosphate glasses; PLD; Rare earth; Photonic structures

Research units and subsidiaries

The Institute comprises six research departments and two branches.

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Departments
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Subsidiaries

RADO

Departamentul Remote Sensing (RADO)

Cercetare si dezvoltare tehnologica pentru obtinerea si gestionarea informatiilor despre mediu
ITC

Departamentul Inginerie Tehnologica si Constructiva, Laseri si Comunicatii prin Fibre Optice (ITC)

Constructia si integrarea laserilor si echipamentelor optice pentru imbunatatirea claitatii vietii in toate formele ei
CERTO

Departamentul Metode si Tehnici Optoelectronice de Reabilitare si Conservare a Patrimoniului Cultural (CERTO)

Cercetare si tehnici avansate de monitorizare conservare si restaurare a operelor de arta
RECAST

Departamentul Sisteme si tehnologii bazate pe plasma si vid pentru noi materiale avansate nanostructurate (RECAST)

Cercetari in sfera tratarii suprafetelo cu plasma si ioni si a tehnologiilor tip ultrahigh vacuum (UHV)
OPTOSPINTRONICA

Departamentul Optospintronica
OMBA

Colectiv Metode Optoelectronice cu Aplicatii Biomedicale (OMBA)
IHP

Institutul de Cercetare pentru hidraulica si pneumatica Bucuresti (IHP)
ICIA

Institutul de Cercetări pentru Instrumentație Analitică (ICIA)